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ASTM E1162-87(2001)

Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)

STANDARD published on 24.4.1987

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The information about the standard:

Designation standards: ASTM E1162-87(2001)
Note: WITHDRAWN
Publication date standards: 24.4.1987
The number of pages: 3
Approximate weight : 9 g (0.02 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM E1162-87(2001) :

Keywords:
data analysis-spectrochemical, depth profiling, secondary ion mass spectrometry (SIMS), spectrometry-mass, sputter depth profiling data, surface analysis-spectrochemical analysis, ICS Number Code 71.040.50 (Physicochemical methods of analysis)