Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
STANDARD published on 10.6.2000
Designation standards: ASTM E1250-88(2000)
Note: WITHDRAWN
Publication date standards: 10.6.2000
The number of pages: 10
Approximate weight : 30 g (0.07 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
Cobalt-60 irradiators, Electrical conductors-semiconductors, Electronic hardness, Electronic materials/applications, Gamma radiation, Hardness tests-radiation (of semiconductors), Ionizing radiation, Irradiance/irradiation, Low-energy gamma radiation, Photon energy spectrum, Radiation exposure-nuclear materials/applications, Radiation-hardness testing, Silicon-semiconductor applications, ionization chambers to assess the low energy gamma component of