ASTM E1426-98

Standard Test Method for Determining the Effective Elastic Parameter for X-Ray Diffraction Measurements of Residual Stress

STANDARD published on 10.10.1998

English -
Online Secure PDF (77.00 USD)

English -

Print design (77.00 USD)

The information about the standard:

Designation standards: ASTM E1426-98
Note: WITHDRAWN
Publication date standards: 10.10.1998
The number of pages: 4
Approximate weight : 12 g (0.03 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM E1426-98 :

Keywords:
Crystal lattice structure, Effective elastic parameter (Eeff), Macroscopic analysis, Polycrystalline materials, Residual stress, Stress, X-ray diffraction, effective elastic parameter (Eeff) for X-ray diffraction measurements of, residual stress, test