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ASTM E1438-06

Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS

STANDARD published on 1.11.2006

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The information about the standard:

Designation standards: ASTM E1438-06
Note: WITHDRAWN
Publication date standards: 1.11.2006
The number of pages: 2
Approximate weight : 6 g (0.01 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM E1438-06 :

Keywords:
ICS Number Code 29.045 (Semiconducting materials)