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ASTM E1438-91(1996)

Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS

STANDARD published on 15.9.1991

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The information about the standard:

Designation standards: ASTM E1438-91(1996)
Note: WITHDRAWN
Publication date standards: 15.9.1991
The number of pages: 2
Approximate weight : 6 g (0.01 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM E1438-91(1996) :

Keywords:
data analysis-spectrochemical, depth resolution, interface width, profile distortion, secondary ion mass spectrometry (SIMS)