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ASTM E2382-04

Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy

STANDARD published on 1.8.2004

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The information about the standard:

Designation standards: ASTM E2382-04
Note: WITHDRAWN
Publication date standards: 1.8.2004
The number of pages: 20
Approximate weight : 60 g (0.13 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM E2382-04 :

Keywords:
Abbe offset error, creep, dilation, hysteresis, nonlinearity, probe-sample mixing, AFM, STM, tip shape, proximal probe, geometric mixing, image reconstruction, ICS Number Code 17.040.20 (Properties of surfaces)