Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
STANDARD published on 10.6.2000
Designation standards: ASTM E668-00
Note: WITHDRAWN
Publication date standards: 10.6.2000
The number of pages: 18
Approximate weight : 54 g (0.12 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
Absorbed radiation dose, Dosimetry, Electrical conductors-semiconductors, Electronic hardness, Electronic materials/applications, Electron radiation, Energy deposition-ionizing radiation, Gamma radiation-electronic components/devices, Hardness tests-radiation (of semiconductors), Radiation-hardness testing, Silicon semiconductors, Thermoluminescent dosimeter (TLD), Threshold detectors-60 MeV, X-irradiation, absorbed dose in radiation-hardness testing-electronic