Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics (Includes all amendments And changes 12/31/2010).
STANDARD published on 15.2.2005
Designation standards: ASTM E722-04e2
Note: WITHDRAWN
Publication date standards: 15.2.2005
The number of pages: 17
Approximate weight : 51 g (0.11 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
displacement damage, electronic hardness, gallium arsenide, hardness parameter, silicon, silicon damage, silicon equivalent damage (SED), 1-MeV equivalent fluence, ICS Number Code 31.080.01 (Semi-conductor devices in general)