ASTM E766-98(2008)e1

Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope (Includes all amendments And changes 3/19/2014).

STANDARD published on 15.6.2008

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The information about the standard:

Designation standards: ASTM E766-98(2008)e1
Note: WITHDRAWN
Publication date standards: 15.6.2008
The number of pages: 6
Approximate weight : 18 g (0.04 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM E766-98(2008)e1 :

Keywords:
calibration, magnification, pitch, scanning electron microscope, Calibration--microscopes, Electron microscopy, Magnification, Scanning electron microscope (SEM), ICS Number Code 37.020 (Optical equipment)