ASTM F108-88e1

Test Method for Resistivity of Silicon Epitaxial Layers by the Three-Probe Voltage Breakdown Method (Includes all amendments And changes 8/13/2021).

STANDARD published on 1.1.1988

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The information about the standard:

Designation standards: ASTM F108-88e1
Note: WITHDRAWN
Publication date standards: 1.1.1988
The number of pages: 6
Approximate weight : 18 g (0.04 lbs)
Country: American technical standard
Category: Technical standards ASTM