
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
STANDARD published on 10.1.1999
Designation standards: ASTM F1190-99
Note: WITHDRAWN
Publication date standards: 10.1.1999
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
Destructive testing-semiconductors, Dosimetry, Electrical conductors-semiconductors, Equivalent monoenergetic neutron fluence, Exposure tests, Fast burst reactors (FBR), Gallium arsenide, Gamma radiation, Germanium-semiconductor applications, Irradiance/irradiation-semiconductors, MeV equivalent fluence, Neutron radiation, Nickel, Radiation exposure-electronic components/devices, Semiconductor wafer, Silicon-semiconductor applications, Sulfur, Thermal neutron radiation