Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
STANDARD published on 1.5.2024
Why Redline?
A PDF redline is a quick and easy way to compare all of the changes between the current, active standard and the previous version.
With a redline you'll immediately see:
Save Time and Trouble!
With a Redline you no longer have to spend time trying to determine what has changed in the new standard! Redlines save you time and ensure you see what the changes are to the standard.
Price
When you select the "Active + Redline" option you get both documents! Best of all, the cost of an Active + Redline is only slightly more than buying the Active Standard by itself.
Designation standards: ASTM F1192-24
Publication date standards: 1.5.2024
The number of pages: 12
Approximate weight : 36 g (0.08 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
SEB, SEE, SEFI, SEGR, SEL, SEP, SEP cross section, SEU, single event, single event effect, single event phenomena, single event upset, space environment,, ICS Number Code 31.080.01 (Semi-conductor devices in general)