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ASTM F1227-89(1999)

Test Method for Total Mass Loss of Materials and Condensation of Outgassed Volatiles on Microelectronics-Related Substrates (Withdrawn 2000)

STANDARD published on 10.4.1999

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The information about the standard:

Designation standards: ASTM F1227-89(1999)
Note: WITHDRAWN
Publication date standards: 10.4.1999
The number of pages: 6
Approximate weight : 18 g (0.04 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F1227-89(1999) :

Keywords:
Collected volatile condensable materials (CVCM), Condensables, Electrical conductors-semiconductors, Electronic materials/applications, Mass loss, Microelectronics industry, Outgassing properties, Silicon semiconductors, Thermoplastics, Thermosetting plastics, Total mass loss (TML), Vacuum testing, Volatile matter content, total mass loss of materials and condensation of outgassed volatiles on, microelectronics-related substrates, test, ICS Number Code 83.140.20 (Laminated sheets)