ASTM F1260M-96

Standard Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations [Metric]

STANDARD published on 1.1.1996

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The information about the standard:

Designation standards: ASTM F1260M-96
Note: WITHDRAWN
Publication date standards: 1.1.1996
The number of pages: 8
Approximate weight : 24 g (0.05 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F1260M-96 :

Keywords:
electromigration, electromigration metallization, integrated circuit, microelectronics, open circuit, resistance increase, time-to-failure, ICS Number Code 17.220.20 (Measurement of electrical and magnetic quantities), 31.200 (Integrated circuits. Microelectronics)