ASTM F1260M-96(2003)

Standard Test Method for Estimating Electromigration Median Time-to-Failure and Sigma of Integrated Circuit Metallizations [Metric] (Withdrawn 2009)

STANDARD published on 10.6.1996

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The information about the standard:

Designation standards: ASTM F1260M-96(2003)
Note: WITHDRAWN
Publication date standards: 10.6.1996
The number of pages: 8
Approximate weight : 24 g (0.05 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F1260M-96(2003) :

Keywords:
electromigration, electromigration metallization, integrated circuit, microelectronics, open circuit, resistance increase, time-to-failure