
Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits
STANDARD published on 10.11.1995
Designation standards: ASTM F1262M-95
Note: WITHDRAWN
Publication date standards: 10.11.1995
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
digital integrated circuits, digital IC´s, functional errors, ionizing, pulsed radiation, radiation, transient radiation, upset threshold