
Test Method for Determining the Mean Interface Trap Density of Mosfets by Charge-Pumping (Withdrawn 1997)
Designation standards: ASTM F1340-92
Note: WITHDRAWN
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
ICS Number Code 31.080.30 (Transistors)