Standard Test Method for Generation Lifetime and Generation Velocity of Silicon Material by Capacitance-Time Measurements of Metal-Oxide-Silicon (MOS) Capacitors (Withdrawn 2003)
STANDARD published on 1.1.2000
Designation standards: ASTM F1388-92(2000)
Note: WITHDRAWN
Publication date standards: 1.1.2000
The number of pages: 7
Approximate weight : 21 g (0.05 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
capacitance-time measurements, C-t measurements, generation lifetime, lifetime, generation velocity, MOS capacitor, silicon, ICS Number Code 31.060.01 (Capacitors in general)