ASTM F1467-18

Standard Guide for Use of an X-Ray Tester (approximately equal10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

STANDARD published on 1.3.2018

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The information about the standard:

Designation standards: ASTM F1467-18
Note: WITHDRAWN
Publication date standards: 1.3.2018
The number of pages: 18
Approximate weight : 54 g (0.12 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F1467-18 :

Keywords:
ionizing radiation effects, microcircuits, radiation hardness, semiconductor devices, X-ray testing,, ICS Number Code 31.020 (Electronic components in general)