ASTM F1467-25

Standard Guide for Use of an X-Ray Tester (?10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

STANDARD published on 1.6.2025

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The information about the standard:

Designation standards: ASTM F1467-25
Publication date standards: 1.6.2025
The number of pages: 18
Approximate weight : 54 g (0.12 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F1467-25 :

Keywords:
ionizing radiation effects, microcircuits, radiation hardness, semiconductor devices, X-ray testing,, ICS Number Code 31.020 (Electronic components in general)