Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

The information about the standard:

Designation standards: ASTM F1467-99
Note: WITHDRAWN
Publication date standards: 10.1.1999
The number of pages: 17
Approximate weight : 51 g (0.11 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F1467-99 :

Keywords:
Collimator, Electrical conductors-semiconductors, Electronic hardness, Experimental design, Hardness tests-radiation (of semiconductors), Ionizing radiation, Low energy ([aprox] 10 keV photons) X-ray sources, Microcircuits, Microelectronic device processing, Radiation effects testing, Radiation exposure-electronic components/devices, Radiation-hardness testing, Semiconductor device testing, X-ray testing, X-ray tester ([aprox] 10 keV photons)-ionizing radiation effects testing