
Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Reduction Glow Discharge Mass Spectrometer
STANDARD published on 10.12.1997
    
        Designation standards: ASTM F1845-97
                
                
                
                Note:    WITHDRAWN
               
                Publication date standards:  10.12.1997
        The number of pages: 4
Approximate weight : 12 g (0.03 lbs)
        Country:          American technical standard
        Category: Technical standards ASTM
        
                
              
Keywords:
aluminum, aluminum-copper alloys, aluminum-copper-silicon alloys, aluminum-silicon alloys, electronics, glow dishcarge mass spectrometer (GDMS), purity analysis, sputtering target, trace metallic impurities