ASTM F1845-97(2002)

Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Reduction Glow Discharge Mass Spectrometer

STANDARD published on 10.12.2002

English -
PDF - Immediate download (73.00 USD)

English -

Print design (73.00 USD)

The information about the standard:

Designation standards: ASTM F1845-97(2002)
Note: WITHDRAWN
Publication date standards: 10.12.2002
The number of pages: 4
Approximate weight : 12 g (0.03 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F1845-97(2002) :

Keywords:
aluminum, aluminum-copper alloys, aluminum-copper-silicon alloys, aluminum-silicon alloys, electronics, glow dishcarge mass spectrometer (GDMS), purity analysis, sputtering target, trace metallic impurities, ICS Number Code 29.050 (Superconductivity and conducting materials)