ASTM F1892-04

Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices

STANDARD published on 1.5.2004

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The information about the standard:

Designation standards: ASTM F1892-04
Note: WITHDRAWN
Publication date standards: 1.5.2004
The number of pages: 39
Approximate weight : 117 g (0.26 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F1892-04 :

Keywords:
ASIC (application specific integrated circuit), bipolar, cobalt 60 testing, gamma ray tests, ionizing radiation testing, MOS, radiation hardness, semiconductor devices, time dependent effects, total dose testing, X-ray testing, ICS Number Code 31.080.01 (Semi-conductor devices in general)