ASTM F1892-06

Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices

STANDARD published on 1.7.2006

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The information about the standard:

Designation standards: ASTM F1892-06
Note: WITHDRAWN
Publication date standards: 1.7.2006
The number of pages: 40
Approximate weight : 120 g (0.26 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F1892-06 :

Keywords:
ASIC (application specific integrated circuit), bipolar, cobalt 60 testing, gamma ray tests, ionizing radiation testing, MOS, radiation hardness, semiconductor devices, time dependent effects, total dose testing, X-ray testing, ICS Number Code 31.080.01 (Semi-conductor devices in general)