ASTM F1893-98(2003)

Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices

STANDARD published on 10.5.1998

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The information about the standard:

Designation standards: ASTM F1893-98(2003)
Note: WITHDRAWN
Publication date standards: 10.5.1998
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F1893-98(2003) :

Keywords:
burnout, failure, high dose-rate, integrated circuits, ionizing radiation, latchup, microcircuits, semiconductor devices, survivability, ICS Number Code 31.080.01 (Semi-conductor devices in general)