ASTM F2166-02

Standard Practices for Monitoring Non-Contact Dielectric Characterization Systems Through Use of Special Reference Wafers (Withdrawn 2003)

STANDARD published on 10.1.2002

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The information about the standard:

Designation standards: ASTM F2166-02
Note: WITHDRAWN
Publication date standards: 10.1.2002
The number of pages: 7
Approximate weight : 21 g (0.05 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F2166-02 :

Keywords:
dielectric tester, dielectric trap, effective charge, electrical dielectric thickness, flatband voltage, interface trap, line corona, mobile charge, point corona, ICS Number Code 19.080 (Electrical and electronic testing)