Standard Guide for Measuring Characteristics of Sapphire Substrates
STANDARD published on 1.5.2004
Designation standards: ASTM F2358-04
Note: WITHDRAWN
Publication date standards: 1.5.2004
The number of pages: 7
Approximate weight : 21 g (0.05 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
backside processing, compound semiconductors, flatness, form, front-to-front deviation (FFD), measurement, restrained, sag, sapphire, sapphire substrates, sori, taper, total thickness variation (TTV), unrestrained, ICS Number Code 25.100.70 (Abrasives)