ASTM F391-02

Standard Test Methods for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage (Withdrawn 2003)

STANDARD published on 10.12.2002

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The information about the standard:

Designation standards: ASTM F391-02
Note: WITHDRAWN
Publication date standards: 10.12.2002
The number of pages: 10
Approximate weight : 30 g (0.07 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F391-02 :

Keywords:
diffusion length, minority carriers, polysilicon, silicon, single crystal silicon, surface photovoltag, ICS Number Code 29.045 (Semiconducting materials)