ASTM F397-02

Standard Test Method for Resistivity of Silicon Bars Using a Two-Point Probe (Withdrawn 2003)

STANDARD published on 10.12.2002

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The information about the standard:

Designation standards: ASTM F397-02
Note: WITHDRAWN
Publication date standards: 10.12.2002
The number of pages: 11
Approximate weight : 33 g (0.07 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F397-02 :

Keywords:
polysilicon, resistivity, silicon, two-point probe, ICS Number Code 29.045 (Semiconducting materials)