Standard Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum

The information about the standard:

Designation standards: ASTM F398-92(1997)
Note: WITHDRAWN
Publication date standards: 10.6.1997
The number of pages: 10
Approximate weight : 30 g (0.07 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F398-92(1997) :

Keywords:
Carrier concentration, Electrical conductors-semiconductors, Gallium arsenide, Germanium-semiconductor applications, Impurities-semiconductors, Infrared (IR) analysis-semiconductors, Minority carriers, Plasma resonance (wavelength), Reflectance and reflectivity-electronic materials/applications, Resonance wavelength, Silicon-semiconductor applications, Spectrophotometry-infrared (of semiconductors), Wavelength, majority carrier concentration in doped semiconductors, by measuring