ASTM F522-94

Test Method for Stacking Fault Density of Epitaxial Layers of Silicon by Interference-Contrast Microscopy (Withdrawn 1998)

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The information about the standard:

Designation standards: ASTM F522-94
Note: WITHDRAWN
The number of pages: 4
Approximate weight : 12 g (0.03 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F522-94 :

Keywords:
ICS Number Code 29.045 (Semiconducting materials)