ASTM F613-93

Test Method for Measuring Diameter of Semiconductor Wafers (Withdrawn 2001)

STANDARD published on 1.1.1993

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The information about the standard:

Designation standards: ASTM F613-93
Note: WITHDRAWN
Publication date standards: 1.1.1993
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F613-93 :

Keywords:
Diameter-electronic components/devices, Electrical conductors-semiconductors, silicon slices/wafers- diameter, test,, Silicon-semiconductor applications, slices/wafers-diameter, test, ICS Number Code 77.040.01 (Testing of metals in general)