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ASTM F615M-95(2008)

Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric)

STANDARD published on 15.6.2008

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The information about the standard:

Designation standards: ASTM F615M-95(2008)
Note: WITHDRAWN
Publication date standards: 15.6.2008
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F615M-95(2008) :

Keywords:
current pulse, current pulse burnout, metallization burnout, safe current pulse, semiconductor burnout, Burnout resistance, Current measurement--semiconductors, Current pulse burnout, Destructive testing--semiconductors, Electrical conductors (semiconductors), Electrical resistance/resistivity--semiconductors, Metallization burnout, Pulse testing, Rectangular current test pulse application, Safe current pulse, Semiconductor burnout, Silicon semiconductors