Standard Test Method for Measuring MOSFET Drain Leakage Current
STANDARD published on 1.1.1992
Designation standards: ASTM F616-92
Note: WITHDRAWN
Publication date standards: 1.1.1992
The number of pages: 3
Approximate weight : 9 g (0.02 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
Current measurement-semiconductors, Design-electronic components, Electrical conductors-semiconductors, Electrical measurements, Integrated circuits, Leak testing-electron devices, MOSFETs, MOSFET drain leakage current, test, ICS Number Code 31.080.30 (Transistors)