Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]

The information about the standard:

Designation standards: ASTM F744M-10
Note: WITHDRAWN
Publication date standards: 1.5.2010
The number of pages: 7
Approximate weight : 21 g (0.05 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F744M-10 :

Keywords:
DIC, digital integrated circuits, dose rate, ionizing radiation, radiation dose rate, threshold for upset, upset, Circuitry, Current measurement--semiconductors, Destructive testing--semiconductors, Dose rate threshold, Dosimetry, Electrical conductors (semiconductors), Electron linear accelerator, Flash X-ray machines (FXR), Irradiance/irradiation--semiconductors, Lasers and laser applications, Linear threshold voltage, Radiation exposure--electronic components/devices, Upset threshold, Voltage