Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits

The information about the standard:

Designation standards: ASTM F744M-97
Note: WITHDRAWN
Publication date standards: 1.1.1997
The number of pages: 6
Approximate weight : 18 g (0.04 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F744M-97 :

Keywords:
Circuitry, Current measurement-semiconductors, Destructive testing-semiconductors, Dose rate threshold, Dosimetry, Electrical conductors-semiconductors, Electron linear accelerator, Flash x-ray machines (FXR), Integrated circuits, Irradiance/irradiation-semiconductors, Lasers and laser applications, Linear threshold voltage, Radiation exposure-electronic components/devices, Upset threshold, Voltage, radiation dose rate threshold for determining upset threshold of digital