ASTM F744M-97(2003)

Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]

STANDARD published on 10.2.1997

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The information about the standard:

Designation standards: ASTM F744M-97(2003)
Note: WITHDRAWN
Publication date standards: 10.2.1997
The number of pages: 6
Approximate weight : 18 g (0.04 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F744M-97(2003) :

Keywords:
DIC, digital integrated circuits, dose rate, ionizing radiation, radiation dose rate, threshold for upset, upset