Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors

The information about the standard:

Designation standards: ASTM F76-08
Note: WITHDRAWN
Publication date standards: 15.6.2008
The number of pages: 14
Approximate weight : 42 g (0.09 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F76-08 :

Keywords:
gallium arsenide, Hall coefficient, Hall data, Hall mobility, Hall resistivity, semiconductor, silicon, single crystal, van der Pauw, Bridge-type electrical/electronic materials, Crystal lattice structure, Eight-contact semiconductor specimens, Electrical conductors (semiconductors), Electrical resistance/resistivity--semiconductors, Etching (materials/process), Gallium arsenide phosphide, Germanium--semiconductor applications, Hall effect measurement, Lamellar semiconductor materials