ASTM F76-86(1996)e1

Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors (Includes all amendments And changes 8/16/2017).

STANDARD published on 31.10.1986

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The information about the standard:

Designation standards: ASTM F76-86(1996)e1
Note: WITHDRAWN
Publication date standards: 31.10.1986
The number of pages: 13
Approximate weight : 39 g (0.09 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F76-86(1996)e1 :

Keywords:
gallium arsenide, Hall coefficient, Hall data, Hall mobility, Hall resistivity, semiconductor, silicon, single crystal, van der Pauw