ASTM F769-00

Standard Test Method for Measuring Transistor and Diode Leakage Currents (Withdrawn 2006)

STANDARD published on 10.6.2000

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The information about the standard:

Designation standards: ASTM F769-00
Note: WITHDRAWN
Publication date standards: 10.6.2000
The number of pages: 3
Approximate weight : 9 g (0.02 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F769-00 :

Keywords:
diode, junction leakage, leakage current, radiation testing, total radiation dose, transistor, ICS Number Code 31.080.10 (Diodes), 31.080.30 (Transistors)