Practice for Measuring Dose Rate Response of Linear Integrated Circuits
STANDARD published on 1.1.1992
Designation standards: ASTM F773-92
Note: WITHDRAWN
Publication date standards: 1.1.1992
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
Circuitry, Current measurement-semiconductors, Destructive testing-semiconductors, Dose rate threshold, Dosimetry, Electrical conductors-semiconductors, Electron linear accelerator, Flash x-ray machines (FXR), Integrated circuits, Ionizing radiation, Irradiance/irradiation-semiconductors, Lasers and laser applications, Linear threshold voltage, Radiation exposure-electronic components/devices, Total dose, Voltage, dose rate response of linear integrated circuits, practice