Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices (Includes all amendments And changes 2/2/2017).
STANDARD published on 1.12.2010
Designation standards: ASTM F980-10e1
Note: WITHDRAWN
Publication date standards: 1.12.2010
The number of pages: 7
Approximate weight : 21 g (0.05 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
annealing factor, annealing function, displacement damage, integrated circuits, neutron damage, neutron degradation, photoconducting device, rapid annealing, semiconductor devices ,, ICS Number Code 29.045 (Semiconducting materials)