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ASTM F980-92

Guide for The Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

STANDARD published on 1.1.1992

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The information about the standard:

Designation standards: ASTM F980-92
Note: WITHDRAWN
Publication date standards: 1.1.1992
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F980-92 :

Keywords:
Annealing, Defects-semiconductors, Destructive testing-semiconductors, Displacement damage, Electrical conductors-semiconductors, Electronic hardness, Hardness tests-radiation (of semiconductors), Integrated circuits, Neutron radiation, Pulsed neutron-radiation source, Radiation exposure-electronic components/devices, Radiation-hardness testing, Short term damage, Vulnerability, rapid annealing of neutron-induced displacement damage in semiconductor, devices, guide,, Rapid annealing effects