ASTM F980M-96(2003)

Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices [Metric]

STANDARD published on 10.6.1996

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The information about the standard:

Designation standards: ASTM F980M-96(2003)
Note: WITHDRAWN
Publication date standards: 10.6.1996
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F980M-96(2003) :

Keywords:
annealing factor, displacement damage, integrated circuits, neutron damage, neutron degradation, rapid annealing, semiconductor devices