Standard Test Method for Determining the Effective Elastic Parameter for X-Ray Diffraction Measurements of Residual Stress (Includes all amendments And changes 2/27/2015).
STANDARD published on 1.6.2009
Designation standards: ASTM E1426-98(2009)e1
Note: WITHDRAWN
Publication date standards: 1.6.2009
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
elastic parameter, residual stress, x-ray diffraction, Crystal lattice structure, Effective elastic parameter (Eeff), Macroscopic analysis, Polycrystalline materials, Residual stress, Stress--metallic materials, X-ray diffraction analysis, ICS Number Code 71.040.50 (Physicochemical methods of analysis)