ASTM E1438-11(2019)

Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS

STANDARD published on 1.11.2019

English -
PDF - Immediate download (55.00 USD)

The information about the standard:

Designation standards: ASTM E1438-11(2019)
Publication date standards: 1.11.2019
The number of pages: 3
Approximate weight : 9 g (0.02 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM E1438-11(2019) :

Keywords:
ICS Number Code 29.045 (Semiconducting materials)