ASTM E2244-11

Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer

STANDARD published on 1.11.2011

English -
PDF - Immediate download (83.00 USD)

The information about the standard:

Designation standards: ASTM E2244-11
Note: WITHDRAWN
Publication date standards: 1.11.2011
The number of pages: 11
Approximate weight : 33 g (0.07 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM E2244-11 :

Keywords:
cantilevers, combined standard uncertainty, deflection measurements, fixed-fixed beams, interferometry, length measurements, microelectromechanical systems, MEMS, polysilicon, residual strain, strain gradient, test structure, ICS Number Code 37.040.20 (Photographic paper, film and plates. Cartridges)