Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics (Includes all amendments And changes 10/20/2014).
STANDARD published on 1.6.2009
Designation standards: ASTM E722-09e1
Note: WITHDRAWN
Publication date standards: 1.6.2009
The number of pages: 27
Approximate weight : 81 g (0.18 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
displacement damage, electronic hardness, gallium arsenide, hardness parameter, silicon, silicon damage, silicon equivalent damage (SED), 1-MeV equivalent fluence, Displacement--electronic materials/applications, Electrical conductors (semiconductors), Electronic hardness, Gamma radiation--electronic components/devices, 1MeV equivalent fluence, Neutron flux/fluence, Neutron sensors, Radiation-hardness testing, Silicon equivalent damage (SED), Silicon semiconductors