NORMSERVIS s.r.o.

ASTM F1192-11

Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

STANDARD published on 1.10.2011

English -
PDF - Immediate download (83.00 USD)
English -
Print design (83.00 USD)

The information about the standard:

Designation standards: ASTM F1192-11
Note: WITHDRAWN
Publication date standards: 1.10.2011
The number of pages: 11
Approximate weight : 33 g (0.07 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F1192-11 :

Keywords:
SEB, SEE, SEFI, SEGR, SEL, SEP, SEP cross section, SEU, single event, single event effect, single event phenomena, single event upset, space environment: Destructive testing--semiconductors, Dosimetry, Electrical conductors (semiconductors), Electron radiation, Failure end point--electronic components/devices, Fluence, Galactic cosmic rays, Germanium--semiconductor applications, Integrated circuits, Ionizing radiation, Irradiance/irradiation--semiconductors, Linear energy transfer (LET)